Project description

JRP Number: 14IND13

JRP Title: Metrology for the photonics industry – optical fibres, waveguides and applications (PhotInd)

JRP Timing: Start:   01/08/2015,  End:   31/07/2018


JRP-Coordinator: Antti Lassila, Tel: +358 40 767 8584


Participants in the Work Packages (WP)

WP No Work Package Name Active JRP-Participants
(WP leader in bold)
WP1 Development of measurement techniques for the characterisation
of advanced optical fibres
VTT, Aalto, CMI, CSIC,
Metrosert, FhG, JCM, Oplatek, UEF, nLIGHT
WP2 Development of metrology for photonic interconnects NPL, VTT, CSIC, Arden, FhG, JCM, Oplatek, UEF, WWU,
Menlo, Seagate, Toptica
WP3 Development of fibre optic measuring instruments and
Arden, JCM, WWU
WP4 Measurement comparisons of the methods developed in
CSIC, Aalto, CMI,
Metrosert, NPL, Arden, WWU, Oplatek, UEF, METAS, nLIGHT, VTT
WP5 Creating Impact CMI, All partners
WP6 Management and Coordination VTT, All partners

Introduction and motivation

Modern photonic systems utilise novel components, whose dimensional and optical properties cannot be reliably measured using classical techniques. Dedicated measuring instruments are commercially available for some of the required characteristics, but they are often uncalibrated and provide insufficient accuracy. New measurement technologies and improved metrology for the European photonics industry are needed to strengthen its competitiveness. The overall objective of the project is to address that necessity.

This project will develop online and offline characterisation techniques for the latest generation of photonic components and devices in both fibre and waveguide optics. The work will underpin new component development and manufacture and will support the related photonic industries. Thorough and precise characterisation tools will be provided, thus supporting the emerging technology of embedded waveguides on optical backplanes used as short range interconnects within, for example, data storage systems. Given the high bandwidth, low power consumption and immunity to EM interference of these waveguides, their precise metrology will favour their position as a viable solution to cope with the demands posed by increases in data rates.

The project will also develop necessary calibration techniques and reference materials, allowing calibration of the newest generation of measuring instruments, which are used in many rapidly growing and very demanding domains like avionics, sensors, telecommunication and automotive industries.